Public links: | WG8 Homepage | SD1: WG8 Projects | SD3: WG8 Meetings |
Links for WG8 Members: | WG8 Members' Homepage | SD4: Maintenance Document for Proximity cards |
SD5: Action Items |
ISO/IEC JTC1/SC17/WG8 N 1200
List of WG8 Documents N 1151 - N 1200
Link to
the TF2
Documents list
Link
to
the TF4
Documents list
Click on a
document number for downloading. Only documents marked by a green background can be accessed without password |
Abbreviations for status information: ACT = further actions required IN = input document INF = for information OUT = output document |
Higher Document Numbers (N 1201 - N 1250) |
INF ACT INF IN INF IN IN IN OUT IN OUT IN IN IN OUT OUT OUT OUT OUT OUT OUT OUT
Document
Register ISO/IEC JTC1/SC17/WG8
BALLOT RESULT – Defect Report
and Technical Corrigendum 1 for – International Standard ISO/IEC
14443-3:2001/AM1: Identification cards – Contactless integrated
circuit(s) cards – Proximity cards – Part 3: initialization and
anticollision – Amendment 1: Bit rates for fc/6
(=SC17 N
2977)
DCOR
ballot was from 2005-12-16 to 2006-03-16. Ballot is in N 1180.
Contribution from France:
Additional French comments on ISO/IEC CD 14443-1 on
"Incompatibility between Class 1 antennae and specifications and dual
interface cards"
BALLOT RESULT – ISO/IEC CD 14443-1 –
Identification cards – Contactless integrated circuit cards – Proximity
cards – Part 1: Physical characteristics
(=SC17 N
2966)
CD ballot was from
2005-11-21 to 2006-02-21. Ballot is in N 1178.
(Version in WORD, for more
efficient processing of the ballot comments at the WG8 meeting)
Contribution from Austria:
Request
to correct insufficiencies in ISO/IEC 10373-6/AM5
Contribution from WG3 Liaison
Officer Junichi Sakaki:
Letter
and Memo to ICAO NTWG regarding request for comments on WG3/TF4 SD06
(WG8 N 1194)
(=WG3/TF4 N 0158)
Contribution from WG3 Liaison
Officer Junichi Sakaki:
Draft
ICAO Technical Report, being developed by the ISO/IEC JTC1/SC17/WG3/TF4
(Test Methods) RF & Protocol group, on:
RF protocol and application test standard for ePassports - Part 2:
Tests for air interface, anticollision and transport protocol, Version
0.9, Date: Feb 10, 2006
Contribution from WG3 Liaison
Officer Junichi Sakaki:
Report
from ISO/IEC JTC1/SC17/WG3/TF4 (Test Methods) to the ICAO NTWG meeting,
held on 2006-02-21/24 in Rome, Italy
Contribution from WG3 Liaison
Officer Junichi Sakaki:
Draft
Minutes of the meeting of ISO/IEC JTC1/SC17/WG3/TF4 (Test Methods) RF
& Protocol group, held on 2006-01-31/02-02 in Ottawa, Canada
Draft Agenda of the 36th
meeting of ISO/IEC JTC1/SC17/WG8 in Vienna, Austria, on
2006-04-06/07 (Revision 4)
(=SC17 N
2984)
(Meeting information are
provided in N 1186)
Draft Agenda of the 3rd
meeting of ISO/IEC JTC1/SC17/WG8/TF4 in Vienna, Austria, on
2006-04-04/05
(=TF4 N 19
R1)
(Meeting information are
provided in N 1186)
Draft Agenda of the 24th
meeting of ISO/IEC JTC1/SC17/WG8/TF2 in Vienna, Austria, on
2006-04-03
(=TF2 N 451)
(Meeting information are
provided in N 1186)
WD ISO/IEC 14443-3 - Identification
cards - Contactless integrated circuit(s) cards - Proximity cards -
Part 3: Initialization and anticollision
WD ISO/IEC 14443-2 - Identification
cards - Contactless integrated circuit(s) cards - Proximity cards -
Part 2: Radio frequency power and signal interface
Calling
Notices for the 24th meeting
of WG8/TF2, the 3rd meeting of WG8/TF4 and the 36th meeting of WG8, all
held in Vienna, Austria, within the period 2006-04-03/07
(SC17 N 2948)
BALLOT RESULT – Proposal for a
new
work item – Multiple PICCs in a single operating
field
(=SC17 N
2927)
NP
ballot was from
2005-10-17 to 2006-01-17. Ballot is in N 1177.
The Ballot Result will be dealt with at the next WG8/TF2 meeting. TF2's
resolution of the NP comments and a work programme related to the NP
will be proposed to WG8 at its next meeting. Members of WG8 and its
Task Forces are invited to submit contributions.
Minutes of the
2nd meeting of ISO/IEC JTC1/SC17/WG8/TF4 being held in London, U.K., on
2006-01-11/12
(=TF4 N
18)
Contribution from OTI:
Technical considerations on Multiple eVisas in ePassports
(=TF4 N 11
= TF2 N 454)
Contribution from Israel:
Proposal for multi-chip/multi-type anticollision sequence
(=TF4 N 7)
Calling Notice and agenda for the
2nd meeting of ISO/IEC JTC1/SC17/WG8/TF4 being held in London, U.K., on
2006-01-11/12 (Revision 2)
BALLOT – Defect Report and
Technical Corrigendum 1 for – International Standard ISO/IEC
14443-3:2001/AM1: Identification cards – Contactless integrated
circuit(s) cards – Proximity cards – Part 3: initialization and
anticollision – Amendment 1: Bit rates for fc/64, fc/32 and fc/16
(=SC17 N
2921)
DCOR
ballot was from 2005-12-16 to 2006-03-16.
ISO/IEC JTC1 Resolution 21 - JTC 1 Use
of the Patent Statement and Licensing Declaration
(=SC17 N
2914)
BALLOT – ISO/IEC CD 14443-1 –
Identification cards – Contactless integrated circuit cards – Proximity
cards – Part 1: Physical characteristics
(=SC17 N
2892)
CD
ballot was from 2005-11-21 to 2006-02-21.
BALLOT - Proposal for a new
work item - Multiple PICCs in a single operating field
(=SC17 N
2873)
NP
ballot was from
2005-10-17 to 2006-01-17. Ballot Result is in N 1185.
ISO/IEC
JTC1/SC17 Standing Document 3 - SC17 Work Programme including all
published standards and target date summary for all work items under
development
(=SC17 N
2863)
ISO/IEC
JTC1/SC17 Business Plan for Period November 2005 to October 2006
(=SC17 N
2862)
Contribution from Austria and
Germany following the Call for Technical Information as requested in N
1171:
ePassport Conformity Testing - Test Plan for ICAO compliant Proximity
Coupling Devices (PCD) - Layer 1-4 Version 0.5.1
(=TF4 N 6)
Draft text of a Defect Report to ISO/IEC 14443-3/AM1
According to WG8 Resolution 35.05 this text is circulated
within WG8 for checking until 2nd November 2005 and will then be
launched as NP ballot according to the SC17 Resolution 553/05
Resolutions of the
18th Plenary Meeting of ISO/IEC JTC1/SC17 being held in Sun
City, Republic of South Africa, 2005-09-05/07 (Revision 1)
(=SC17 N
2860)
Call for technical
information (to be taken into
account and used in WG8/TF4)
(=TF4 N 2 =
SC17 N 2872)
Report of the Convenor of
WG8 to the 18th Plenary Meeting of ISO/IEC JTC1/SC17 being held in the
Republic of South Africa, 2005-10-05/07
(=SC17 N
2856)
Contribution
from axalto, France
Mechanical durability constraints for Class 1
Article
provided by ANSI/INCITS:
Limited Use Proximity Integrated Circuit Cards
ANSI Standard
(B10.5N05-113):
Identification cards - Contactless Integrated Circuits(s) Proximity
Card - Limited Use cards
Comments from OTI on the
draft MCAP NP in N 1162
Contribution
from axalto, Gemplus, Infineon and ST:
Technical contribution on ISO/IEC 14443-3:2001/AMD1 regarding "Extended
TR2 mechanism proposal"
Draft text of CD ISO/IEC 14443-1 (Revision) —
Identification cards — Contactless integrated circuit card(s) —
Proximity cards — Part 1: Physical characteristics
Contribution
from ST
Delayed comments on clause K.2 of N 1113 = SC17 N 2749: Ballot ISO/IEC
10373-6/FP-DAM5 - Identification cards - Test methods - Part 6:
Proximity Cards - Amendment 5: Bit rates of fc/64, fc/32 and fc/16
NWI proposal for "Multiple PICCs in a
single operating field" (Revision 2)
Revision 2 of that NWI proposal is the version which has integrated
WG3's position from its meeting on 2005-10-03/05 held in Sun City,
South Africa
Contribution
from Gemplus, France
Considerations regarding the class concept in ISO/IEC 14443
Delayed DIN comments on N 1110 = SC17 N
2743: Ballot ISO/IEC
10373-6/FP-DAM1 - Identification
cards - Test methods - Part 6: Proximity cards - Amendment 1: Protocol
test methods for proximity cards
Minutes of the
inaugural meeting of ISO/IEC JTC1/SC17/WG8/TF4 being held in Sun City,
Republic of South
Africa, on 2005-09-26
(=TF4 N 3)
Text of ISO/IEC
10373-6/FDAM5 – Identification cards – Test methods – Part
6: Proximity cards – Amendment 5: Bit rates of fc/64, fc/32 and fc/16
Text of ISO/IEC 10373-6/FDAM4 –
Identification cards – Test methods – Part
6: Proximity Cards – Draft Amendment 4: Additional test methods for PCD
RF interface and PICC alternating field exposure
Notification that this
amendment was sent to ISO Central Secretariat (SC17 N 2923)
Text of ISO/IEC 10373-6/FDAM3 –
Identification cards - Test methods – Part
6: Proximity cards – Amendment 3: Protocol test methods for proximity
coupling devices
Notification
that this
amendment was sent to ISO Central Secretariat (SC17 N 3009)
Text of ISO/IEC 10373-6/FDAM1 –
Identification cards – Test methods – Part 6: Proximity Cards – Draft
Amendment 1: Protocol test methods for proximity cards (Revision
2)
Disposition of comments on ISO/IEC 10373-6/FP-DAM5 –
Identification cards – Test methods – Part
6: Proximity cards – Amendment 5: Bit rates of fc/64, fc/32 and fc/16
(=SC17 N
3028)
Disposition of comments on ISO/IEC 10373-6/FP-DAM4 –
Identification cards – Test methods – Part
6: Proximity Cards – Draft Amendment 4: Additional test methods for PCD
RF interface and PICC alternating field exposure (Revision 1)
(=SC17 N
2922)
Disposition of comments on ISO/IEC 10373-6/FP-DAM3 –
Identification cards - Test methods – Part
6: Proximity cards – Amendment 3: Protocol test methods for proximity
coupling devices
(=SC17 N
3008)
Disposition of comments on
ISO/IEC 10373-6/FP-DAM1 –
Identification cards – Test methods – Part 6: Proximity Cards – Draft
Amendment 1: Protocol test methods for proximity cards
(=SC17 N
3045)
Higher Document Numbers (N 1201 - N 1250) |
© 2006