Venue:

Sun City Conference Center Sun City Resort South Africa For further organisational details and registration refer to N 1120.

Additional Meeting Documents (only available at meetings)

Note: Some of the following items may contain references to hyperlinked documents, which however are password protected, and can therefore be accessed by WG8 Members only.

1.		Opening of the meeting on 27 September 2005 at 9 a.m.
2.		Roll call of the delegates Membership list update SD2: WG8 Members (only available at meetings)
3.		Adoption of the agenda
4.		Introduction of input documents other than posted on the web
5.		Reports
	5.1	Matters from SC17
	5.2	Matters from SC17 Working Groups
		5.2.1   Working Group WG1
		5.2.2   Working Group WG3 (& ICAO)
		5.2.3   Working Group WG4
	5.3	SC31
	5.4	SC37
	5.5	Other reports
6.		ISO/IEC 14443
	6.1	Report from WG8/TF4 and related decisions/actions N 1059: Minutes of the inaugural meeting of ISO/IEC JTC1/SC17/WG8/TF4 being held in Sun City, Republic of South Africa, on 2005-09-26
	6.2	Review of SD4: Maintenance Document for Proximity card standards SD4: Maintenance Document for Proximity cards
	6.3	Progress report on Limited use contactless smart cards (LUC) N 1127: WD ISO/IEC 14443-1:2005-07 — Identification cards — Contactless integrated circuit card(s) — Proximity cards — Part 1: Physical characteristics N 1128: CD text for ISO/IEC 15457-1:2005-07 — Identification cards — Thin flexible cards — Part 1: Physical characteristics N 1129: WD ISO/IEC 15457-2:2005-07 — Identification cards — Thin flexible cards — Part 2: Magnetic recording technique N 1130: WD ISO/IEC 15457-3:2005-07 — Identification cards — Thin flexible cards — Part 3: Test methods
	6.4	Revision of ISO/IEC 14443-1 N 1127: WD ISO/IEC 14443-1:2005-07 — Identification cards — Contactless integrated circuit card(s) — Proximity cards — Part 1: Physical characteristics N 1148: Contribution from ASK, France: White paper on "No class to ensure interoperability, but more reader tests" N 1161: Contribution from Gemplus, France: Considerations regarding the class concept in ISO/IEC 14443 N 1164: Draft text of CD ISO/IEC 14443-1
	6.5	MRTD related standardization items N 1146: DIN Proposal for ePassport Conformity Testing (Version 1.02) All MRTD Technical Reports (TR) can be downloaded from:   http://www.icao.int/mrtd/download/technical.cfm
	6.6	Multiple chips and antennas in ePassports (MCAP) N 1088: Contribution from Infineon/Philips: Electronic passport and electronic visa, Air interface N 1162 R2: NWI proposal for "Multiple PICCs in a single operating field"
7.		ISO/IEC 10373-6
	7.1	Resolution of comments on: ISO/IEC 10373-6/FPDAM1 - Identification cards - Test methods - Part 6: Proximity Cards - Amendment 1: Protocol test methods for proximity cards N 1110: FCD BALLOT - ISO/IEC 10373-6/FPDAM1 N 1137: BALLOT RESULT - 10373-6/FPDAM1 N 1160: Delayed DIN comments on N 1110 = SC17 N 2743: Ballot ISO/IEC 10373-6/FP-DAM1 N 1165: Contribution from Axalto, Gemplus, Infineon and ST: Technical contribution on ISO/IEC 14443-3:2001/AMD1 regarding "Extended TR2 mechanism proposal" N 1151: Disposition of comments on 10373-6/FPDAM1 (will be developed at the Sun City meeting) N 1155: Text of 10373-6/FDAM1 (will be developed at the Sun City meeting)
	7.2	Resolution of comments on: ISO/IEC 10373-6/FPDAM3 - Identification cards - Test methods - Part 6: Proximity Cards - Amendment 3: Protocol test methods for proximity coupling devices   N 1111: FCD BALLOT - ISO/IEC 10373-6/FPDAM3 N 1138: BALLOT RESULT - 10373-6/FPDAM3 N 1152: Disposition of comments on 10373-6/FPDAM3 (will be developed at the Sun City meeting) N 1156: Text of 10373-6/FDAM3 (will be developed at the Sun City meeting)
	7.3	Resolution of comments on: ISO/IEC 10373-6/FPDAM4 - Identification cards - Test methods - Part 6: Proximity cards - Draft Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure N 1112: FCD BALLOT - ISO/IEC 10373-6/FPDAM4 N 1139: BALLOT RESULT - 10373-6/FPDAM4 N 1133: French contribution regarding the general comment for ISO/IEC 10373-6/FP-DAM4: Additional test methods for PCD RF interface and PICC alternating field exposure N 1144: Contribution from Gemplus, France: Proposed modifications for the source code contained in Annex F of  ISO/IEC 10373-6 N 1145: Contribution from axalto, France: Proposal for new PCD test methods N 1153 R1: Disposition of comments on 10373-6/FPDAM4 N 1157: Text of 10373-6/FDAM4
	7.4	Resolution of comments on: ISO/IEC 10373-6/FPDAM5 - Identification cards - Test methods - Part 6: Proximity cards - Draft Amendment 5: Bit rates of fc/64, fc/32 and fc/16 N 1113: FCD BALLOT - ISO/IEC 10373-6/FPDAM5 N 1140: BALLOT RESULT - 10373-6/FPDAM5 N 1149: Contribution from Infineon: Delayed comments on N 1113 = SC17 N 2749: Ballot ISO/IEC 10373-6/FP-DAM5 N 1163: Contribution from ST: Delayed comments on clause K.2 of N 1113 = SC17 N 2749: Ballot ISO/IEC 10373-6/FP-DAM5 N 1154: Disposition of comments on 10373-6/FPDAM5 (will be developed at the Sun City meeting) N 1158: Text of 10373-6/FDAM5 (will be developed at the Sun City meeting)
8.		ISO/IEC 15693
	8.1	Progress report from the TF3 Convener on the revisions of ISO/IEC 15693-1, 15693-2 and 15693-3 N 1123: Resolutions from the adhoc joint meeting of ISO/IEC JTC1/SC31 and SC17/WG8 regarding the recommended actions for the revison of ISO/IEC 15693 and in particular the responsibilities of the AFI codings and registrations in both the committees SC31 and SC17
9.		Progress Report on Form Factor Free Option (FFF) N 1031_Res33.05: WG8 Resolution 33.05 on FFF
10.		Progress Report on N 874 R2 "Guidelines on RFU (Reserved for future use)" as Technical Report N 874 R2: Draft Technical Report on "Guidelines on RFU"
11.		Update of the WG8 Projects' details SD1: WG8 Projects
12.		Dates and venues of next meetings SD3: Next Meetings
13.		Any other business
14.		Closure of meeting on 30 September 2005 no later than at 4 p.m.